Special Inspection

Positive Material Identification

Principle and Method

"Positive Material Identification” is a method of analyzing X-rays of the unique characteristics of the sample by semiconductor detector (Si-Pin).
When electromagnetic waves are transmitted to the material, the atom is excited from its Ground state to Excited state as it absorbs energy, and when it returns to its Ground state, it generates an X-ray of atomic specificity.
Using this principle, a method is compared the Spectrum pattern from unknown samples with the Spectrum pattern of known substances to determine that if the latter pattern is included in the former pattern, the former contains the latter substance.

Advantage of PMI

  • It is not simply a qualitative analysis of elements, but is measured in the form of chemicals.
  • The state of the constituent element can be known. (Composition analysis, state analysis)
  • The sample can be analyzed in small amount, and the sample adjustment is relatively simple, and is not damaged by the measurement. (Non-destructive analysis)
  • The sample is in the form of powder, or its shape can be measured in any shape, such as plate shape, massive shape.

Analyzable metal components

C, Ti, V, Cr, Mn, Fe, Co, Ni, Cu, Zn, Nb, Mo, W, Pb, Bi, Sn, Pd, Ag, Al Etc.

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